Mini AFM
A compact, easy-to-run atomic force microscope built for teaching labs and early-stage research. Clear topography and nanoscale measurement without a dedicated metrology room or a steep learning curve.
Our Products
Precision instruments and automated systems designed for metrology, inspection, and advanced research.
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Automated Slide-Scanning Microscope
An automated slide-scanning microscope that digitizes full specimen slides for medical education. Hands-free loading, focus, and capture turn a tray of slides into shareable, high-resolution digital images for the classroom.
Microscope Automation Retrofit Kit
A bolt-on kit that converts a conventional microscope into a repeatable, fully automated imaging system — motorized stage, autofocus, and a controller with stitching, workflow automation, and data management, with no new optics required.
Probe Card Inspection System
An enclosed, fully automated inspection system for semiconductor probe cards. Motorized stages, machine vision, and nanoscale metrology verify probe-tip geometry, planarity, and alignment with sub-micron repeatability — hands-free, with safety interlocks and signal-tower status for the production floor.
Custom Inspection Systems
Tailored inspection and metrology systems built around your unique workflow, samples, and throughput requirements.
Need something specific?
We build custom systems for unique measurement and inspection challenges.