Probe Card Inspection System
Automated probe-card metrology, in one enclosure.
Overview
An enclosed, fully automated inspection system for semiconductor probe cards. Motorized stages, machine vision, and nanoscale metrology verify probe-tip geometry, planarity, and alignment with sub-micron repeatability — hands-free, with safety interlocks and signal-tower status for the production floor.
Brochure
Probe Card Inspection System brochure
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Brochure
Rendering brochure…
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